Term: January 1996 – present
Employer: Institute of Physical Problems named after F. V. Lukin
Laboratory: Solid Nanotechnology
Department: Nanoelectronics
Address: passage 4806, building 6, Zelenograd, Moscow, 124460, Russian Federation
Field: scanning probe microscopy and nanotechnology
Position: staff scientist
Activities: As SPM-microscopist, participated in experimental STM/AFM investigations (ambient, low-energy plasma, HV, and UHV environments) of porous Si surface, GaAlAs heterostructures, ordered SiO2 nanoparticles (opal photonic crystals), SiNbN superconductor microwave sensor, nanostructured electrochemically-polished Al, ordered porous alumina, Pd clusters, carbon nanotubes (CNT), surface ordered structures (MePhSiCl2, VOCl3, TiCl4, etc.) and other materials. Researched feature formation by local probe oxidation of thin films (Ti, Zr, WC, MoC, etc.) and by indenting a probe into plastic surface (Au, Al, Cu, polycarbonate, Langmuir-Blodgett film, etc.) to develop a record medium for a large capacity probe storage device (PSD). Made critical probe nanolithography to form a junction of a field-effect nanotransistor. Conducted investigations of thin carbon films plasma-deposited on low-density polyethylene (LDPE), polyurethane (PU), and poly(methyl methacrylate) (PMMA) in order to improve biocompatibility of artificial human implants (blood-vessels, crystalline lens, mitral valves, etc.) fabricated of these materials.
As SPM-developer, solved task of automatic scanner calibration by natural standards such as crystalline lattices. Elaborated a simple readback method for a probe storage device, which memory bits were represented by single atoms/molecules. Suggested a feature-oriented scanning (FOS) methodology intended for implementation of high precision SPM-measurements, automatic surface characterization and unmanned bottom-up nanofabrication. Developed an automatic drift correction method built on techniques of counter-scanning and topography feature recognition. Built up an AFM-based setup and conduct measurements of bimaterial microcantilevers used as room-temperature IR-sensors. Formulated operation principles, suggested construction, and control methods of a high-precision versatile walking robot-nanopositioner intended for use in SPM and various nanotechnological processes. Developed a drift-insensitive method for automatic distributed calibration of probe microscope scanner in nanometer range by crystal lattice as a length standard.
Term: February 1990 – January 1996
Employer: “Delta” Microelectronics and Nanotechnology Research Institute
Laboratory: Scanning Tunneling Microscopy
Department: Nanotechnology
Address: 2 Schelkovskoye shosse, Moscow, 105122, Russian Federation
Field: scanning tunneling microscopy
Position: researcher
Activities: Worked on a fast-acting scanning tunneling microscope (STM), in particular, a fast-acting digital control system intended for tunnel junction stabilization. Developed a method correcting STM piezoscanner nonlinearity and hysteresis. Within bounds of the above tasks carried out: formulation of technical requirements; prototype analysis; working-out of instrument concept and basic architecture solutions; building of a math model; engineering calculations and estimates; synthesis of flow-charts and operation algorithms; design of principle digital schemes (logic, ADC, DAC, i/o interface, embedded microcontroller); writing and debugging of a program kernel for microscope low-level control; design of calibration and self-testing routines; assemblage and test of the experimental STM.
Activities: Developed a specialized equipment to balance video rotary heads of a tape recorder. Dealt with measurement automation, math data processing and sensor conjugation with a local controller.
Measured topography and parameters of the hexagonal superstructure (HSS) on surface of highly oriented pyrolytic graphite (HOPG) with high-precision & high spatial resolution by applying feature-oriented scanning (FOS) approach, 2012
Discovered a new kind of hexagonal superstructure (HSS) on surface of highly oriented pyrolytic graphite (HOPG), 2012
Formulated operation principles, suggested construction, and control methods of a versatile miniature walking robot-nanopositioner intended for high-precision manipulation of samples, substrates, micro/nanosensors, and micro/nanotools, 2010
Developed a deposition process of catalytic nickel nanoparticles (NNP) making possible a low-temperature synthesis of carbon nanostructures (CNS) by plasma-enhanced chemical vapor deposition (PECVD) method, 2009
Developed a new counter-scanning technique intended for automatic correction of scan distortions induced by probe drift relative to a sample surface, 2000
Proposed, developed and experimentally proved an original feature-oriented scanning (FOS) methodology applicable for both high precision surface measurements, nanometrology, and unmanned bottom-up nanofabrication, 1999
Proposed an original approximating model for hysteresis that permits to effectively correct nonlinearity of a probe microscope piezoscanner, 1993
Suggested a novel concept, control method, and design of a fast-acting scanning tunneling microscope which may serve as a platform for building a high-performance nanoassembler, 1993
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Participated in investigations by the following governmental grants
most recent first
Synthesis and investigation of mesoscopic-scaled carbon nanostructures to form surfaces with biocompatible properties, the Russian Foundation for Basic Research, 2005-2007
Application of algorithms and information methods for data readback in petabit capacity probe storage device, the Russian Foundation for Basic Research, 2005
Development of low-temperature synchrotron radiation stimulated processes forming surface structures applicable to medicine, the Moscow Committee on Science and Technologies, 2003-2004
Investigation of physical-chemical peculiarities of radiation-stimulated modification of surfaces of crystalline and noncrystalline solids aimed to form specific properties of the solids, the Russian Foundation for Basic Research, 2002-2004
Investigation of synchrotron light source induced chemisorption processes on semiconductor surfaces during synthesizing multilayer microstructures, the Russian Foundation for Basic Research, 1998-2000
Cited in the international biographical reference book Leading Scientists of the World, the International Biographical Centre, Cambridge, England, 2007
Cited in the international biographical reference book Leading Engineers of the World, the International Biographical Centre, Cambridge, England, 2007
Term: January 2002 – December 2002
School: Institute of Physical Problems named after F. V. Lukin
Address: passage 4806, building 6, Zelenograd, Moscow, 124460, Russian Federation
Course: postgraduate (extension)
Specialty: solid body electronics, radio electronic components, micro and nanoelectronics,
quantum devices (no. 05.27.01)
Degree: Ph. D.
Thesis: Object-oriented scanning for probe microscopy and nanotechnology
Qualification: scientist
Major: scanning probe microscopy and nanotechnology
Term: September 1990 – November 1993
School: “Scientific Center” Advanced Research Enterprise
Address: passage 4806, building 6, Zelenograd, Moscow, 124460, Russian Federation
Course: postgraduate
Specialty: special purpose systems, their mathematical support and organization of computational processes (no. 05.13.15)
Qualification: engineer-researcher
Major: scanning tunneling microscopy
Term: September 1984 – June 1990
School: Moscow State Technical University named after N. E. Bauman
Department: Laser and Optoelectronic Systems
Faculty: Radio Electronics and Lasers
Address: 2-ya Baumanskaya St., bldg. 5, Moscow, 107005, Russian Federation
Course: undergraduate and graduate
Specialty: optical and optoelectronic systems (no. 19.10)
Degree: master of science
Thesis: Digital controller for scanning tunneling microscope
Qualification: optical engineer
Major: scientific instruments
Graduating group: RL2
Term: September 1978 – June 1984
School: High School no. 19 named after V. M. Kazantsev
Address: Preobrazhenskaya St., bldg. 98, Belgorod, 308009, Russian Federation
Graduating class: 10b
from the grand joint session of the Rospatent and the Federal Institute of Industrial Property (FIPS) dedicate to the World Intellectual Property Day)