Publications

Selected publications
Book chapters
Complete list of papers
Complete list of reports
Ph. D. thesis
Non peer-reviewed materials




Selected publications

most recent first

An improved parametric model for hysteresis loop approximation
Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode
Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode
STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite
Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description
Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface
Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition
Feature-oriented scanning methodology for probe microscopy and nanotechnology
Object-oriented scanning for probe microscopy and nanotechnology
Digital data readback for a probe storage device
Automatic lateral calibration of tunneling microscope scanners
Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope
Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes


Abstracts of selected papers

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Review of Scientific Instruments, volume 91, issue 6, number 065106, pages 1-31, June 2020

An improved parametric model for hysteresis loop approximation

Rostislav V. Lapshin1, 2

1Solid Nanotechnology Laboratory, Institute of Physical Problems, Zelenograd, Moscow 124460, Russian Federation
2Department of Integral Electronics and Microsystems, Moscow Institute of Electronic Technology, Zelenograd, Moscow 124498, Russian Federation


A number of improvements have been added to the existing analytical model of hysteresis loops defined in parametric form. In particular, three phase shifts are included in the model, which permits us to tilt the hysteresis loop smoothly by the required angle at the split point as well as to smoothly change the curvature of the loop. As a result, the error of approximation of a hysteresis loop by the improved model does not exceed 1%, which is several times less than the error of the existing model. The improved model is capable of approximating most of the known types of rate-independent symmetrical hysteresis loops encountered in the practice of physical measurements. The model allows building smooth, piecewise-linear, hybrid, minor, mirror-reflected, inverse, reverse, double, and triple loops. One of the possible applications of the model developed is linearization of a probe microscope piezoscanner. The improved model can be found useful for the tasks of simulation of scientific instruments that contain hysteresis elements.


Copyright © 2020 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and American Institute of Physics

Full text

Supplementary material Hysteresis loop

Slides

Original source: Review of Scientific Instruments, AIP
arXiv.org repository e-preprint
Article Usage & Citations

Russian translation

Copyright © 2021 R. V. Lapshin. The Russian translation of the article may be downloaded for personal use only. Any other use requires prior permission of the author

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Applied Surface Science, volume 470, pages 1122-1129, March 2019

Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode

Rostislav V. Lapshin1, 2

1Solid Nanotechnology Laboratory, Institute of Physical Problems, Zelenograd, Moscow 124460, Russian Federation
2Department of Integral Electronics and Microsystems, National Research University of Electronic Technology, Zelenograd, Moscow 124498, Russian Federation


Graphical abstract

A method is described intended for distributed calibration of a probe microscope scanner consisting in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby each point of the movement space of the scanner can be defined by a unique set of scale factors. Feature-oriented scanning (FOS) methodology is used to implement the distributed calibration, which permits to exclude in situ the negative influence of thermal drift, creep and hysteresis on the obtained results. The sensitivity of LCCs to errors in determination of position coordinates of surface features forming the local calibration structure (LCS) is eliminated by performing multiple repeated measurements followed by building regression surfaces. There are no principle restrictions on the number of repeated LCS measurements. Possessing the calibration database enables correcting in one procedure all the spatial distortions caused by nonlinearity, nonorthogonality and spurious crosstalk couplings of the microscope scanner piezomanipulators. To provide high precision of spatial measurements in nanometer range, the calibration is carried out using natural standards – constants of crystal lattice. The method allows for automatic characterization of crystal surfaces at room temperature. The method may be used with any kind of scanning probe microscope (SPM).


Copyright © 2019 Elsevier B. V. This article may be downloaded for personal use only. Any other use requires prior permission of the author and Elsevier B. V.

Full text

Slides

Original source: Applied Surface Science, Elsevier
arXiv.org repository e-preprint
Article Usage & Citations

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Applied Surface Science, volume 378, pages 530-539, August 2016

Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

Rostislav V. Lapshin1, 2

1Solid Nanotechnology Laboratory, Institute of Physical Problems, Zelenograd, Moscow, 124460, Russian Federation
2Department of Photosensitive Nano and Microsystems, Moscow Institute of Electronic Technology, Zelenograd, Moscow, 124498, Russian Federation


Graphical abstract

A method of distributed calibration of a probe microscope scanner is suggested. The main idea consists in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby each point of the movement space of the scanner can be characterized by a unique set of scale factors. Feature-oriented scanning (FOS) methodology is used as a basis for implementation of the distributed calibration permitting to exclude in situ the negative influence of thermal drift, creep and hysteresis on the obtained results. Possessing the calibration database enables correcting in one procedure all the spatial systematic distortions caused by nonlinearity, nonorthogonality and spurious crosstalk couplings of the microscope scanner piezomanipulators. To provide high precision of spatial measurements in nanometer range, the calibration is carried out using natural standards – constants of crystal lattice. One of the useful modes of the developed calibration method is a virtual mode. In the virtual mode, instead of measurement of a real surface of the standard, the calibration program makes a surface image “measurement” of the standard, which was obtained earlier using conventional raster scanning. The application of the virtual mode permits simulation of the calibration process and detail analysis of raster distortions occurring in both conventional and counter surface scanning. Moreover, the mode allows to estimate the thermal drift and the creep velocities acting while surface scanning. Virtual calibration makes possible automatic characterization of a surface by the method of scanning probe microscopy (SPM).


Copyright © 2016 Elsevier B. V. This article may be downloaded for personal use only. Any other use requires prior permission of the author and Elsevier B. V.

Full text

A short video presentation (just slides)

Original source: Applied Surface Science, Elsevier
arXiv.org repository e-preprint
Article Usage & Citations

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Applied Surface Science, volume 360, part B, pages 451-460, January 2016

STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite

Rostislav V. Lapshin1, 2

1Solid Nanotechnology Laboratory, Institute of Physical Problems, Zelenograd, Moscow, 124460, Russian Federation
2Department of Photosensitive Nano and Microsystems, Moscow Institute of Electronic Technology, Zelenograd, Moscow, 124498, Russian Federation


Graphical abstract

A description is given of a three-dimensional box-shaped graphene (BSG) nanostructure formed/uncovered by mechanical cleavage of highly oriented pyrolytic graphite (HOPG). The discovered nanostructure is a multilayer system of parallel hollow channels located along the surface and having quadrangular cross-section. The thickness of the channel walls/facets is approximately equal to 1 nm. The typical width of channel facets makes about 25 nm, the channel length is 390 nm and more. The investigation of the found nanostructure by means of a scanning tunneling microscope (STM) allows us to draw a conclusion that it is possible to make spatial constructions of graphene similar to the discovered one by mechanical compression, bending, splitting, and shifting graphite surface layers. The distinctive features of such constructions are the following: simplicity of the preparation method, small contact area between graphene planes and a substrate, large surface area, nanometer cross-sectional sizes of the channels, large aspect ratio. Potential fields of application include: ultra-sensitive detectors, high-performance catalytic cells, nanochannels for DNA manipulation, nanomechanical resonators, electron multiplication channels, high-capacity sorbents for hydrogen storage.


Copyright © 2016 Elsevier B. V. This article may be downloaded for personal use only. Any other use requires prior permission of the author and Elsevier B. V.

Full text

A short video presentation (just slides)

Original source: Applied Surface Science, Elsevier
arXiv.org repository e-preprint
Article Usage & Citations

Russian translation

Copyright © 2015 R. V. Lapshin. The Russian translation of the article may be downloaded for personal use only. Any other use requires prior permission of the author

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Applied Surface Science, volume 359, pages 629-636, December 2015

Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

Rostislav V. Lapshin1, 2

1Solid Nanotechnology Laboratory, Institute of Physical Problems, Zelenograd, Moscow, 124460, Russian Federation
2Department of Photosensitive Nano and Microsystems, Moscow Institute of Electronic Technology, Zelenograd, Moscow, 124498, Russian Federation


Graphical abstract

The method of distributed calibration of a probe microscope scanner consists in a search for a net of local calibration coefficients (LCCs) in the process of automatic measurement of a standard surface, whereby each point of the movement space of the scanner can be defined by a unique set of scale factors. Feature-oriented scanning (FOS) methodology is used to implement the distributed calibration, which permits to exclude in situ the negative influence of thermal drift, creep and hysteresis on the obtained results. The sensitivity of LCCs to errors in determination of position coordinates of surface features forming the local calibration structure (LCS) is eliminated by performing multiple repeated measurements followed by building regression surfaces. There are no principle restrictions on the number of repeated LCS measurements. Possessing the calibration database enables correcting in one procedure all the spatial distortions caused by nonlinearity, nonorthogonality and spurious crosstalk couplings of the microscope scanner piezomanipulators. To provide high precision of spatial measurements in nanometer range, the calibration is carried out using natural standards – constants of crystal lattice. The method may be used with any scanning probe instrument.


Copyright © 2015 Elsevier B. V. This article may be downloaded for personal use only. Any other use requires prior permission of the author and Elsevier B. V.

Full text

A short video presentation (just slides)

Original source: Applied Surface Science, Elsevier
arXiv.org repository e-preprint
Article Usage & Citations

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Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 1, pages 5-16, January 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, volume 4, number 1, pages 1-11, January-February 2010

Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface

R. V. Lapshin1, 2, A. P. Alekhin1, 2, A. G. Kirilenko1, S. L. Odintsov1, V. A. Krotkov1

1State Scientific Center of Russian Federation, Institute of Physical Problems named after F. V. Lukin, Zelenograd, Moscow, Russia
2Moscow Institute of Physics and Technology, Dolgoprudny, Moscow Region, Russia


Smoothing of nanometer-scale asperities of poly(methyl methacrylate) (PMMA) film by using vacuum ultraviolet (VUV) with wavelength λ=123.6 nm is investigated. During the VUV-treatment, an exposure time and a residual air pressure in the working chamber are varied. A nanostructured surface of PMMA film is used as a sample to be exposed. The nanostructured surface is obtained by treating the initial spin-coated smooth PMMA film in oxygen radio-frequency plasma. The conclusion regarding to degree of VUV-exposure is based on the changes fixed in topography morphology and roughness of the nanostructured surface. Surface topography of the PMMA film is measured by the atomic-force microscopy (AFM). Recognition of morphological surface features and determination of their main geometrical characteristics on the AFM-images are performed by using the method of virtual feature-oriented scanning. The detailed investigation of morphology and Fourier spectra shows that the nanostructured surface of PMMA film is partially-ordered.The VUV-smoothing method developed can be used for treatment of electron-beam, UV or X-ray sensitive PMMA-resists, PMMA-elements of microelectromechanical systems, biomedical PMMA-implants, and for validation of nanotechnological equipment having UV sources.


Copyright © 2010 MAIK “Nauka/Interperiodica”. This article may be downloaded for personal use only. Any other use requires prior permission of the author and MAIK “Nauka/Interperiodica”

Full text (in Russian)

Original source: MAIK “Nauka/Interperiodica”

Full text

Original source: Springer Science+Business Media LLC
Article Usage & Citations

Copyright © 2010 Pleiades Publishing Ltd. This article may be downloaded for personal use only. Any other use requires prior permission of the author and Pleiades Publishing Ltd.

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Measurement Science and Technology, volume 18, issue 3, pages 907-927, March 2007

Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition

Rostislav V. Lapshin

Solid Nanotechnology Laboratory, Institute of Physical Problems, Zelenograd, Moscow, 124460, Russian Federation

An experimentally proved method for the automatic correction of drift-distorted surface topography obtained with a scanning probe microscope (SPM) is suggested. Drift-produced distortions are described by linear transformations valid for the case of rather slow changing of the microscope drift velocity. One or two pairs of counter-scanned images (CSIs) of surface topography are used as initial data. To correct distortions, it is required to recognize the same surface feature within each CSI and to determine the feature lateral coordinates. Solving a system of linear equations, the linear transformation coefficients suitable for CSI correction in the lateral and the vertical planes are found. After matching the corrected CSIs, topography averaging is carried out in the overlap area. Recommendations are given that help both estimate the drift correction error and obtain the corrected images where the error does not exceed some preliminarily specified value. Two nonlinear correction approaches based on the linear one are suggested that provide a greater precision of drift elimination. Depending on the scale and the measurement conditions as well as the correction approach applied, the maximal error may be decreased from 8-25% to 0.6-3%, typical mean error within the area of corrected image is 0.07-1.5%. The method developed permits us to recover drift-distorted topography segments/apertures obtained by using feature-oriented scanning. The suggested method may be applied to any instrument of the SPM family.


Copyright © 2007 Institute of Physics Publishing Ltd. This article may be downloaded for personal use only. Any other use requires prior permission of the author and Institute of Physics Publishing

Full text

Original source: Measurement Science and Technology, IOP
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Russian translation

Copyright © 2007 R. V. Lapshin. The Russian translation of the article may be downloaded for personal use only. Any other use requires prior permission of the author

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Nanotechnology, volume 15, issue 9, pages 1135-1151, September 2004

Feature-oriented scanning methodology for probe microscopy and nanotechnology

Rostislav V. Lapshin

Solid Nanotechnology Laboratory, Institute of Physical Problems, Zelenograd, Moscow, 124460, Russia

A real-time scanning algorithm is suggested which uses features of the surface as reference points at relative movements. Generally defined hill- or pit-like topography elements are taken as the features. The operation of the algorithm is based upon local recognition of the features and their connection to each other. The permissible class of surfaces includes ordered, partially ordered, or disordered surfaces if their features have comparable extents in the scan plane. The method allows one to exclude the negative influence of thermodrift, creep, and hysteresis over the performance of a scanning probe microscope. Owing to the possibility of carrying out an unlimited number of averages, the precision of measurements can be considerably increased. The distinctive feature of the method is its ability of topography reconstruction when the ultimate details are smaller than those detectable by a conventional microscope scan. The suggested approach eliminates the restrictions on scan size. Nonlinearity, nonorthogonality, cross coupling of manipulators as well as the Abbé offset error are corrected with the use of scan-space-distributed calibration coefficients which are determined automatically in the course of measuring a standard surface by the given method. The ways of precise probe positioning by local surface features within the fine manipulator field and the coarse manipulator field, automatic probe return into the operational zone after sample dismounting, automatic determination of exact relative position of the probes in multiprobe instruments, as well as automatic successive application of the whole set of probes to the same object on the surface are proposed. The possibility of performing accurately localized low-noise spectroscopy is demonstrated. The developed methodology is applicable for any scanning probe devices.


Copyright © 2004 Institute of Physics Publishing Ltd. This article may be downloaded for personal use only. Any other use requires prior permission of the author and Institute of Physics Publishing

Full text

Original source: Nanotechnology, IOP
Article Usage & Citations

Russian translation

Copyright © 2004 R. V. Lapshin. The Russian translation of the article may be downloaded for personal use only. Any other use requires prior permission of the author

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Ph. D. Thesis, Moscow, December 2002

Object-oriented scanning for probe microscopy and nanotechnology

Rostislav V. Lapshin

Institute of Physical Problems, Zelenograd, Moscow, 124460, Russia

Object- or feature-oriented scanning (OOS) methodology is suggested, developed, and proved experimentally. While measuring or crossing topography, surface features are used as reference points. All probe movements are performed relatively from one feature to another placed nearby. Generally defined hill- or pit-like surface elements are used as features. Surface topography is measured by small parts called segments. Each segment is a square neighborhood of the surface feature. The segments are obtained during the conventional raster-like scanning. The resulting topography image is reconstructed by using the feature segments and the relative distances between the features. All types of surfaces (i. e., ordered, quasiordered, and disordered) may be scanned in feature-oriented manner if only their features have comparable extents in the lateral plane. The proposed OOS permits to eliminate the negative effect of thermodrift, creep, and hysteresis. As a result, an unlimited number of averagings may be carried out theoretically. Due to a large number of the averagings, precision of the scanning probe microscope can be considerably increased. It is possible also to improve resolution of the instrument under the stipulation that a tip of the probe is sharp enough. The suggested approach eliminates the restrictions on scan size. Nonlinearity, nonorthogonality, cross coupling of manipulators as well as the Abbé offset error are corrected with the use of scan-space-distributed calibration coefficients which are determined automatically in the course of measuring a standard surface by the given method. Proposed are the ways of precise probe positioning by local surface features within the fine manipulator field and the coarse manipulator field, automatic probe return into the operational zone after sample dismounting, automatic determination of exact relative position of the probes in multiprobe instruments, as well as automatic successive application of the whole set of probes to the same object on the surface. The possibility of performing accurately localized low-noise spectroscopy is demonstrated. The suggested methodology is applicable for any scanning probe instruments such as scanning tunneling microscope, atomic-force microscope, magnetic force microscope, electrostatic force microscope, near-field scanning optical microscope, and many others, including the scanning electron microscope.


Copyright © 2002 R. V. Lapshin. Ph. D. abstract and thesis may be downloaded for personal use only. Any other use requires prior permission of the author

Abstract (in Russian)


Full text (in Russian)

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Review of Scientific Instruments, volume 71, number 12, pages 4607-4610, December 2000

Digital data readback for a probe storage device

Rostislav V. Lapshin

Institute of Physical Problems, Moscow, Zelenograd 103460, Russia

An experimentally proved method is described for data readback from an information track using separate atoms on a crystal surface as memory elements. The key idea consists of local scanning and recognition of memory elements on the carrier surface followed by attaching the device probe to them so as to keep the probe position over the track.


Copyright © 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and American Institute of Physics

Full text

Original source: Review of Scientific Instruments, AIP
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Review of Scientific Instruments, volume 69, number 9, pages 3268-3276, September 1998

Automatic lateral calibration of tunneling microscope scanners

Rostislav V. Lapshin

Zelenograd Physical Problems Institute, Zelenograd, Moscow, 103460, Russia

A practical method is described to find automatically the calibration coefficients and residual nonorthogonality of a tunneling microscope scanner. As initial data, the coordinates of three atoms were used forming a triangle in a highly oriented pyrolytic graphite surface appearing in the form of a spatially geometrical measure. A recognition procedure is described which can be applied to determine the lateral coordinates of the atoms. Length and orientation distortions were calculated, estimates of calibration errors were given and the requirement on the nonorthogonality limit was formulated for manipulator a given that ensures measurements of the predetermined accuracy. The sensitivity of the method to a noise in atom coordinates was determined. Experimental data showing the practical suitability of the method developed are presented.


Copyright © 1998 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and American Institute of Physics

Full text

Original source: Review of Scientific Instruments, AIP
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Review of Scientific Instruments, volume 66, number 9, pages 4718-4730, September 1995

Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope

Rostislav V. Lapshin

“Delta”, Microelectronics and Nanotechnology Research Institute, 2 Schelkovskoye Shosse, Moscow 105122, Russia

A new model description and type classification carried out on its base of a wide variety of practical hysteresis loops are suggested. An analysis of the loop approximating function was carried out; the parameters and characteristics of the model were defined – coersitivity, remanent polarization, value of hysteresis, spontaneous polarization, induced piezocoefficients, value of saturation, hysteresis losses of energy per cycle. It was shown that with piezomanipulators of certain hysteresis loop types, there is no difference in heat production. The harmonic linearization coefficients were calculated, and the harmonically linearized transfer function of a nonlinear hysteresis element was deduced. The hysteresis loop type was defined that possesses minimum phase shift. The average relative approximation error of the model has been evaluated as 1.5%-6% for real hysteresis loops. A procedure for definition of the model parameters by experimental data is introduced. Examples of using the results in a scan unit of a scanning tunneling microscope for compensation of raster distortion are given.


Copyright © 1995 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and American Institute of Physics

Full text

Original source: Review of Scientific Instruments, AIP
arXiv.org repository e-preprint
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Russian translation

Copyright © 1995 R. V. Lapshin. The Russian translation of the article may be downloaded for personal use only. Any other use requires prior permission of the author

See also Mathcad worksheets Hysteresis loop

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Review of Scientific Instruments, volume 64, number 10, pages 2883-2887, October 1993

Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes

Rostislav V. Lapshin, Oleg V. Obyedkov

“Microelectronica”, R&D and Production Corporation, Schelkovskoye Shosse 2, 105122, Moscow, Russia

The design of a sectional piezoactuator is described, and the principle of operation of a tunnel junction digital stabilization system is given. The total settling time of the system while the least significant section is in operation is 1 µs at 0.01-nm resolution (in the Z direction). The application of the sectional piezoactuator permitted an increase in operating frequency and also eliminated errors caused by the piezoceramics hysteresis. Introduction of a fast-acting ALU as a digital accumulator of regulation errors made it possible to achieve high stability of the loop operation at high operating frequencies. The system suggested can adapt the speed of the loop operation depending on the relief steepness values. The blunting of the tip and sample destruction is avoided because there is a mechanism of smooth approach of the tip to the nominal scanning height.


Copyright 1993 © American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and American Institute of Physics

Full text

Original source: Review of Scientific Instruments, AIP
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Book chapters

  1. R. V. Lapshin, Feature-oriented scanning probe microscopy, Encyclopedia of Nanoscience and Nanotechnology, edited by H. S. Nalwa, vol. 14, pp. 105-115, American Scientific Publishers, 2011 (original source: American Scientific Publishers)
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Complete list of papers

most recent first

  1. R. V. Lapshin, Productive drift-insensitive distributed calibration of probe microscope scanner in nanometer range by three points, 2023 (under preparation)


  2. R. V. Lapshin, Detection of low-contrast beating (moiré) on tunneling microscope scans by method of virtual feature-oriented distributed calibration, 2023 (under preparation)


  3. R. V. Lapshin, Observation of a hexagonal superstructure on pyrolytic graphite by method of feature-oriented scanning tunneling microscopy, 2023 (under preparation)


  4. R. V. Lapshin, Fabrication methods of the polygonal masonry of large tightly-fitted stone blocks with curved surface interfaces in megalithic structures of Peru, Preprints, no. 2021080087, 58 pp., 2023 (DOI: 10.20944/preprints202108.0087.v9, original source: Preprints.org, Russian translation)

  5. R. V. Lapshin, An improved parametric model for hysteresis loop approximation, vol. 91, iss. 6, no. 065106, 31 pp., Review of Scientific Instruments, 2020 (original source: American Institute of Physics, supplementary material Hysteresis loop)


  6. N. A. Djuzhev, R. V. Lapshin, A. M. Belin, A. I. Ovodov, D. V. Novikov, G. D. Demin, Finite-element predictive 3D modelling and optimization of membrane-based thermoresistive MEMS accelerometers, Proceedings of SPIE 11022, International Conference on Micro- and Nano-Electronics 2018, edited by V. F. Lukichev, K. V. Rudenko, vol. 11022, , pp. R1-R10, 2019 (original source: SPIE)


  7. R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode, vol. 470, pp. 1122-1129, Applied Surface Science, 2019 (original source: Elsevier B. V.)


  8. R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, vol. 378, pp. 530-539, Applied Surface Science, 2016 (short video presentation, original source: Elsevier B. V.)


  9. R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, Applied Surface Science, vol. 360, part B, pp. 451-460, 2016 (short video presentation, original source: Elsevier B. V., Russian translation is available)


  10. R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (short video presentation, original source: Elsevier B. V.)


  11. R. V. Lapshin, R. Z. Khafizov, E. A. Fetisov, Mathematical treatment of the output optical image of a focal plane array of uncooled bimaterial detectors of infrared range by method of feature-oriented scanning, Instruments and Experiment Technique, no. 5, pp. 52-58, 2015 (in Russian, original source: eLIBRARY.RU). R. V. Lapshin, R. Z. Khafizov, E. A. Fetisov, Computer processing of the output optical image of a focal plane array of uncooled bimaterial IR-detectors by method of feature-oriented scanning, Instruments and Experimental Techniques, vol. 58, no. 5, pp. 631-636, 2015 (original source: Springer Science+Business Media LLC)


  12. A. A. Sigarev, G. A. Rudakov, R. V. Lapshin, E. A. Fetisov, Study of optical properties and surface structure of thin films of nonstoichiometric silicon nitride formed by means of low-temperature plasmachemical deposition for an implementation in MEMS-structures, Research Journal of Pharmaceutical, Biological and Chemical Sciences, vol. 6, iss. 1, pp. 1815-1825, 2015 (original source: RJPBCS)


  13. R. Lapshin, Feature-oriented scanning probe microscopy: precision measurements, nanometrology, bottom-up nanotechnologies, Electronics: Science, Technology, Business, Special issue “50 years of the Institute of Physical Problems”, no. 9, pp. 94-106, 2014 (in Russian, original source: Technosphera Publishers)


  14. R. Lapshin, P. Azanov, Nickel nanoparticles reduce temperature of synthesis of carbon nanostructures, Electronics: Science, Technology, Business, Special issue “50 years of the Institute of Physical Problems”, no. 9, pp. 112-115, 2014 (in Russian, original source: Technosphera Publishers)


  15. D. B. Rygalin, E. A. Fetisov, R. Z. Khafizov, V. I. Zolotarev, I. A. Reshetnikov, G. A. Rudakov, R. V. Lapshin, E. P. Kirilenko, Promising integral matrix detectors of thermal radiation with optical reading, Russian Microelectronics, vol. 43, no. 7, pp. 516-518, 2014 (original source: Springer Science+Business Media LLC)


  16. R. Z. Khafizov, E. A. Fetisov, R. V. Lapshin, E. P. Kirilenko, V. N. Anastasyevskaya, I. V. Kolpakov, Thermomechanical sensitivity of uncooled bimaterial detector of IR-range fabricated by technology of microoptomechanical systems, Advances in Applied Physics, vol. 1, no. 4, pp. 520-523, 2013 (in Russian, original source: Orion Research & Production Association)


  17. D. B. Rygalin, E. A. Fetisov, R. Z. Khafizov, V. I. Zolotarev, I. A. Reshetnikov, G. A. Rudakov, R. V. Lapshin, E. P. Kirilenko, Advanced infrared focal plane arrays with optical readout, Proceedings of Institutions of Higher Education. Electronics, no. 3, pp. 60-63, 2013 (in Russian, original source: eLIBRARY.RU)


  18. A. P. Alekhin, G. M. Boleiko, S. A. Gudkova, A. M. Markeev, A. A. Sigarev, V. F. Toknova, A. G. Kirilenko, R. V. Lapshin, E. N. Kozlov, D. V. Tetyukhin, Synthesis of biocompatible surfaces by nanotechnology methods, Russian nanotechnologies, vol. 5, nos. 9-10, pp. 128-136, 2010 (in Russian, original source: Park-Media Co.). A. P. Alekhin, G. M. Boleiko, S. A. Gudkova, A. M. Markeev, A. A. Sigarev, V. F. Toknova, A. G. Kirilenko, R. V. Lapshin, E. N. Kozlov, D. V. Tetyukhin, Synthesis of biocompatible surfaces by nanotechnology methods, Nanotechnologies in Russia, vol. 5, nos. 9-10, pp. 696-708, 2010 (original source: Springer Science+Business Media LLC)


  19. R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, no. 1, pp. 5-16, 2010 (in Russian, original source: eLIBRARY.RU). R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, vol. 4, no. 1, pp. 1-11, 2010 (original source: Springer Science+Business Media LLC)


  20. R. V. Lapshin, Availability of feature-oriented scanning probe microscopy for remote-controlled measurements on board a space laboratory or planet exploration rover, Astrobiology, vol. 9, no. 5, pp. 437-442, 2009 (original source: Mary Ann Liebert, Inc.)


  21. R. V. Lapshin, Method for automatic correction of drift-distorted SPM-images, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, no. 11, pp. 13-20, 2007 (in Russian, original source: eLIBRARY.RU). R. V. Lapshin, A method for automatic correction of drift-distorted SPM images, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, vol. 1, no. 6, pp. 630-636, 2007 (original source: Springer Science+Business Media LLC)


  22. R. V. Lapshin, Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition, Measurement Science and Technology, vol. 18, iss. 3, pp. 907-927, 2007 (original source: Institute of Physics Publishing, Russian translation is available)


  23. A. P. Alekhin, A. G. Kirilenko, A. I. Kozlitin, R. V. Lapshin, S. N. Mazurenko, Hydrophobic-hydrophilic nanostructure synthesis on polymer surfaces in low-temperature carbon plasma, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, no. 11, pp. 8-11, 2006 (in Russian, original source: eLIBRARY.RU)


  24. R. V. Lapshin, Automatic distributed calibration of probe microscope scanner, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, no. 11, pp. 69-73, 2006 (in Russian, original source: eLIBRARY.RU)


  25. R. V. Lapshin, Feature-oriented scanning methodology for probe microscopy and nanotechnology, Nanotechnology, vol. 15, iss. 9, pp. 1135-1151, 2004 (original source: Institute of Physics Publishing, Russian translation is available)


  26. A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, Surface morphology of thin carbon films deposited from plasma on polyethylene with low density, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, no. 2, pp. 3-9, 2004 (in Russian, original source: eLIBRARY.RU)


  27. A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev, Investigation of nanostructured carbon coating on polyethylene as a substrate, Journal of Applied Chemistry, vol. 76, no. 9, pp. 1536-1540, 2003 (in Russian, original source: eLIBRARY.RU). A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev, Nanostructured carbon coatings on polyethylene films, Russian Journal of Applied Chemistry, vol. 76, no. 9, pp. 1497-1501, 2003 (original source: Springer Science+Business Media LLC)


  28. S. A. Gavrilov, V. M. Roschin, A. V. Zheleznyakova, S. V. Lemeshko, B. N. Medvedev, R. V. Lapshin, E. A. Poltoratsky, G. S. Rychkov, N. N. Dzbanovsky, N. N. Suetin, AFM investigation of highly ordered nanorelief formation by anodic treatment of aluminum surface, Physics, Chemistry and Application of Nanostructures: Reviews and Short Notes to Nanomeeting 2003, edited by V. E. Borisenko, S. V. Gaponenko, V. S. Gurin, pp. 500-502, World Scientific Publishing, London, UK, 2003 (original source)


  29. R. V. Lapshin, Digital data readback for a probe storage device, Review of Scientific Instruments, vol. 71, no. 12, pp. 4607-4610, 2000 (original source: American Institute of Physics)


  30. R. V. Lapshin, Automatic lateral calibration of tunneling microscope scanners, Review of Scientific Instruments, vol. 69, no. 9, pp. 3268-3276, 1998 (original source: American Institute of Physics)


  31. R. V. Lapshin, V. N. Ryabokony, A. V. Denisov, Measurement of spatial characteristics of ordered surface nanostructures with scanning tunneling microscope, Proceedings of the Second International Scientific and Technical Conference “Microelectronics and Informatics”, part 2, pp. 349-357, Zelenograd, Moscow, Russian Federation, 1997 (in Russian)


  32. R. V. Lapshin, Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope, Review of Scientific Instruments, vol. 66, no. 9, pp. 4718-4730, 1995 (original source: American Institute of Physics, Russian translation is available, see also Mathcad worksheets Hysteresis loop)


  33. R. V. Lapshin, Hysteresis compensation model for STM scanning unit, Proceedings of the Second International Conference on Nanometer-Scale Science and Technology (NANO-II), Herald of Russian Academy of Technological Sciences, vol. 1, no. 7, part B, pp. 511-529, Moscow, Russia, 1994 (see also Mathcad worksheets Hysteresis loop)


  34. R. V. Lapshin, O. V. Obyedkov, Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes, Review of Scientific Instruments, vol. 64, no. 10, pp. 2883-2887, 1993 (original source: American Institute of Physics)
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Complete list of reports

most recent first

  1. N. A. Djuzhev, R. V. Lapshin, A. M. Belin, A. I. Ovodov, D. V. Novikov, G. D. Demin, Finite-element predictive 3D modelling and optimization of membrane-based thermoresistive MEMS accelerometers, The International Conference “Micro- and Nanoelectronics – 2018” (ICMNE-2018), p. 94, Zvenigorod, Moscow, Russian Federation, October 1-5, 2018 (original source)


  2. R. V. Lapshin, Productive drift-insensitive distributed calibration of probe microscope scanner in nanometer range, Proceedings of the XXVI Russian Conference on Electron Microscopy (SEM-2016), vol. 1, pp. 268-269, Zelenograd, Moscow, Russian Federation, May 30 - June 3, 2016 (in Russian, original source). R. V. Lapshin, Productive drift-insensitive distributed calibration of probe microscope scanner in nanometer range, Presentation at the XXVI Russian Conference on Electron Microscopy (SEM-2016), 13 pp., Zelenograd, Moscow, Russian Federation, May 31, 2016 (in Russian, English translation is available)


  3. R. V. Lapshin, Improved approximating model of hysteresis loop for the linearization of a probe microscope piezoscanner, Proceedings of the XIX Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2015), pp. 154-155, Chernogolovka, Russian Federation, June 1-4, 2015 (in Russian, see also Mathcad worksheets Hysteresis loop). R. V. Lapshin, Improved approximating model of hysteresis loop for the linearization of a probe microscope piezoscanner, Presentation at the XIX Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2015), 12 pp., Chernogolovka, Russian Federation, June 2, 2015 (in Russian, English translation is available)


  4. R. V. Lapshin, Periodic changes in lateral sizes of unit cells at STM images of pyrolytic graphite, Proceedings of the XIX Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2015), pp. 152-153, Chernogolovka, Russian Federation, June 1-4, 2015 (in Russian). R. V. Lapshin, Periodic changes in lateral sizes of unit cells at STM images of pyrolytic graphite, Presentation at the XIX Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2015), 13 pp., Chernogolovka, Russian Federation, June 2, 2015 (in Russian, English translation is available)


  5. R. V. Lapshin, Observation of a hexagonal superstructure on pyrolytic graphite by method of feature-oriented scanning tunneling microscopy, Proceedings of the 25th Russian Conference on Electron Microscopy (SEM-2014), vol. 1, pp. 316-317, Chernogolovka, Russian Federation, June 2-6, 2014 (in Russian). R. V. Lapshin, Observation of a hexagonal superstructure on pyrolytic graphite by method of feature-oriented scanning tunneling microscopy, Presentation at the 25th Russian Conference on Electron Microscopy (SEM-2014), 13 pp., Chernogolovka, Russian Federation, June 4, 2014 (in Russian, English translation is available)


  6. R. V. Lapshin, R. Z. Khafizov, E. A. Fetisov, Computer processing of the output optical image of a focal plane array of uncooled bimaterial IR-detectors by method of feature-oriented scanning, Proceedings of the XXIII International Scientific and Engineering Conference on Photoelectronics and Night Vision Devices, pp. 285-289, RD&P Center “Orion”, Moscow, Russian Federation, May 28-30, 2014 (in Russian, original source, English translation is available). R. V. Lapshin, R. Z. Khafizov, E. A. Fetisov, Computer processing of the output optical image of a focal plane array of uncooled bimaterial IR-detectors by method of feature-oriented scanning, Presentation at the XXIII International Scientific and Engineering Conference on Photoelectronics and Night Vision Devices, 10 pages, RD&P Center “Orion”, Moscow, Russian Federation, May 29, 2014


  7. R. V. Lapshin, Hexagonal superlattice on pyrolytic graphite – a promising length standard for nanometer range, Proceedings of the 1st All-Russian Scientific and Technical Conference “Metrology in Nanotechnologies”, pp. 33-36, Moscow, Russian Federation, April 22-24, 2014 (in Russian). R. V. Lapshin, Hexagonal superlattice on pyrolytic graphite – a promising length standard for nanometer range, Presentation at the 1st All-Russian Scientific and Technical Conference “Metrology in Nanotechnologies”, 14 pp., Moscow, Russian Federation, April 22, 2014 (in Russian, English translation is available)


  8. R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, Proceedings of the XVIII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2013), pp. 386-387, Chernogolovka, Russian Federation, June 3-7, 2013 (in Russian). R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, Presentation at the XVIII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2013), 12 pp., Chernogolovka, Russian Federation, June 5, 2013 (in Russian, English translation is available)


  9. V. A. Bespalov, D. B. Rygalin, E. A. Fetisov, R. Z. Khafizov, V. I. Zolotarev, I. A. Reshetnikov, G. A. Rudakov, R. V. Lapshin, E. P. Kirilenko, Advanced designs and technological approaches for integral matrix sensors of thermal radiation with optical signal modulation comprising microoptomechanical system (MOMS), Proceedings of the 3rd International Scientific and Technical Conference “Technologies of Micro and Nanoelectronics in Micro and Nanosystem Devices”, 3 pp., MIET, Zelenograd, Moscow, Russian Federation, November 28-29, 2012 (in Russian). V. A. Bespalov, D. B. Rygalin, E. A. Fetisov, R. Z. Khafizov, V. I. Zolotarev, I. A. Reshetnikov, G. A. Rudakov, R. V. Lapshin, E. P. Kirilenko, Advanced designs and technological approaches for integral matrix sensors of thermal radiation with optical signal modulation comprising microoptomechanical system (MOMS), Presentation at the 3rd International Scientific and Technical Conference “Technologies of Micro and Nanoelectronics in Micro and Nanosystem Devices”, 20 pp., MIET, Zelenograd, Moscow, Russian Federation, November 28, 2012 (in Russian)


  10. R. Z. Khafizov, E. A. Fetisov, R. V. Lapshin, E. P. Kirilenko, V. N. Anastasyevskaya, I. V. Kolpakov, Thermomechanical sensitivity of bimaterial IR-sensors based on microoptomechanical systems, Proceedings of the XXII International Scientific and Engineering Conference on Photoelectronics and Night Vision Devices, pp. 102-104, RD&P Center “Orion”, Moscow, Russian Federation, May 22-25, 2012 (in Russian, original source, English translation is available). R. Z. Khafizov, E. A. Fetisov, R. V. Lapshin, E. P. Kirilenko, V. N. Anastasyevskaya, I. V. Kolpakov, Thermomechanical sensitivity of bimaterial IR-sensors based on microoptomechanical systems, Presentation at the XXII International Scientific and Engineering Conference on Photoelectronics and Night Vision Devices, 11 pages, RD&P Center “Orion”, Moscow, Russian Federation, May 23, 2012


  11. R. V. Lapshin, Distributed calibration of probe microscope scanner in nanometer range, Proceedings of the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2011), p. 94, Chernogolovka, Russian Federation, May 30 - June 2, 2011 (in Russian). R. V. Lapshin, Distributed calibration of probe microscope scanner in nanometer range, Presentation at the XVII Russian Symposium on Scanning Electron Microscopy and Analytical Methods of Investigation of Solids (SEM-2011), 10 pp., Chernogolovka, Russian Federation, June 1, 2011 (in Russian, English translation is available)


  12. R. V. Lapshin, P. V. Azanov, E. P. Kirilenko, Preparation of catalytic nickel nanoparticles of controlled sizes in glow-discharge plasma by repetition of magnetization-deposition cycles, Proceedings of the XV International Symposium “Nanophysics and Nanoelectronics”, vol. 2, pp. 566-567, Nizhni Novgorod, Russian Federation, March 14-18, 2011 (in Russian, original source). R. V. Lapshin, P. V. Azanov, E. P. Kirilenko, Preparation of catalytic nickel nanoparticles of controlled sizes in glow-discharge plasma by repetition of magnetization-deposition cycles, Presentation at the XV International Symposium “Nanophysics and Nanoelectronics”, 12 pp., Nizhni Novgorod, Russian Federation, March 14-18, 2011 (in Russian)


  13. R. V. Lapshin, P. V. Azanov, E. A. Ilyichev, G. N. Petruhin, L. L. Kupchenko, Formation of catalytic Ni-nanoparticles in glow-discharge Ar-plasma for low-temperature synthesis of carbon nanostructures, Proceedings of the XIV International Symposium “Nanophysics and Nanoelectronics”, vol. 2, pp. 563-564, Nizhni Novgorod, Russian Federation, March 15-19, 2010 (in Russian, original source). R. V. Lapshin, P. V. Azanov, E. A. Ilyichev, G. N. Petruhin, L. L. Kupchenko, Formation of catalytic Ni-nanoparticles in glow-discharge Ar-plasma for low-temperature synthesis of carbon nanostructures, Presentation at the XIV International Symposium “Nanophysics and Nanoelectronics”, 11 pp., Nizhni Novgorod, Russian Federation, March 15-19, 2010 (in Russian)


  14. R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, Smoothing of nanoasperities of poly(methyl methacrylate) film by vacuum ultraviolet, Proceedings of the XIII International Symposium “Nanophysics and Nanoelectronics”, vol. 1, pp. 280-281, Nizhni Novgorod, Russian Federation, March 16-20, 2009 (in Russian, original source)


  15. R. V. Lapshin, Automatic distributed calibration of probe microscope scanner, Materials of the Symposium “Nanophysics and Nanoelectronics”, vol. 1, pp. 161-162, Nizhni Novgorod, Russian Federation, March 25-29, 2005 (in Russian, original source)


  16. R. V. Lapshin, Method for automatic correction of drift-distorted SPM-images, Materials of the Symposium “Nanophysics and Nanoelectronics”, vol. 1, pp. 159-160, Nizhni Novgorod, Russian Federation, March 25-29, 2005 (in Russian, original source)


  17. S. A. Gavrilov, V. M. Roschin, A. V. Zheleznyakova, S. V. Lemeshko, B. N. Medvedev, R. V. Lapshin, E. A. Poltoratsky, G. S. Rychkov, N. N. Dzbanovsky, N. N. Suetin, AFM investigation of highly ordered nanorelief formation by anodic treatment of aluminum surface, International Conference “Nanomeeting-2003”, Minsk, Belarus, May 20-23, 2003


  18. R. V. Lapshin, Feature-oriented scanning for spacecraft-borne remote SPM-investigations, Workshop on Micro-Nano Technology for Aerospace Applications, Montreal, Canada, August 25-30, 2002


  19. A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, A. A. Sigarev, AFM studies of the morphology of the carbon layers deposited on medical low-density polyethylene films by the method of pulsed plasma-arc sputtering of graphite, SPIE International Conference on Nanotechnology and MEMS, Galway, Ireland, September 5-6, 2002


  20. S. A. Gavrilov, A. V. Emelyanov, E. A. Ilyichev, R. V. Lapshin, V. M. Roschin, Fabrication technique and characteristic investigation of field-controlled nanotransistors, All-Russian Scientific and Technical Conference “Micro- and Nano-electronics 2001”, vol. 2, p. P1-1, Zvenigorod, Moscow, Russian Federation, October 1-5, 2001 (in Russian)


  21. R. V. Lapshin, Digital data readback method for a probe storage device, The Third International Scientific and Technical Conference “Electronics and Informatics – XXI Century”, pp. 169-170, Zelenograd, Moscow, Russian Federation, November 22-24, 2000 (in Russian)


  22. R. V. Lapshin, Probe positioning of scanning microscope-nanolithograph by local surface features, The Third International Scientific and Technical Conference “Electronics and Informatics – XXI Century”, pp. 167-168, Zelenograd, Moscow, Russian Federation, November 22-24, 2000 (in Russian)


  23. R. V. Lapshin, Correction of drift-distorted SPM-images, The Third International Scientific and Technical Conference “Electronics and Informatics – XXI Century”, pp. 76-77, Zelenograd, Moscow, Russian Federation, November 22-24, 2000 (in Russian)


  24. R. V. Lapshin, Procedure for atom recognition in STM-images, The Third International Scientific and Technical Conference “Microelectronics and Informatics”, pp. 222-223, Zelenograd, Moscow, Russian Federation, November 11-12, 1997 (in Russian)


  25. S. A. Gavrilov, A. V. Emelyanov, R. V. Lapshin, V. N. Ryabokony, O. I. Chegnova, Electrochemical nanometer-scale structuring of silicon surface, The Third International Scientific and Technical Conference “Microelectronics and Informatics”, pp. 155-156, Zelenograd, Moscow, Russian Federation, November 11-12, 1997 (in Russian)


  26. R. V. Lapshin, V. N. Ryabokon, A. V. Denisov, Scanning tunneling microscope measurements of the spatial characteristics of ordered surface nanostructures, The Fourth International Conference on Nanometer-Scale Science and Technology (NANO-IV), Beijing, P. R. China, September 8-12, 1996


  27. A. V. Denisov, R. V. Lapshin, V. N. Ryabokony, Measurement technique of ordered self-assembly nanometer-sized structures with tunneling microscopy, The Second International Scientific and Technical Conference “Microelectronics and Informatics”, pp. 159-160, Zelenograd, Moscow, Russian Federation, November 23-24, 1995 (in Russian)


  28. R. V. Lapshin, Hysteresis compensation model for STM scanning unit, The Second International Conference on Nanometer-Scale Science and Technology (NANO-II), Moscow, Russia, August 2-6, 1993 (see also Mathcad worksheets Hysteresis loop)
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Ph. D. thesis

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Non peer-reviewed materials

most recent first

  1. R. V. Lapshin, Who built the grandiose structures in Peru?, Weekly Magazine “Arguments and Facts”, no. 42, p. 34, October 20, 2021 (in Russian, original source)


  2. D. Pisarenko, R. V. Lapshin, Stone “magic”. Who and how did build the grandiose structures in Peru?, Interview for the Weekly Magazine “Arguments and Facts”, 2021 (in Russian, original source, English translation at the News Read Online)
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